Nikon L300N wafer inspection microscope with brightfield and darkfield inspection

300mm inspection microscope for reflected light inspection

Nikon manual stage with 12" x 14" XY travel, trigger clutch, and glass insert

brightfield, darkfield illuminator with 12v/50W halogen lamphouse

tilt viewing head with camera port and CFUW 10x/25 eyepieces

5/10/20/50x LU Plan BD objectives

Optional: (shown in photo) DIC module, analyzer, and rotating polarizer for Nomarski inspection: inquire